Analysis of NCFET with Si doped HfO2 as ferro-electric material to achieve lower SS

bracu.type.groupResearch Publications
datacite.rightsMetadata Only
dc.contributor.authorRahman, Towfiqur
dc.contributor.authorKhan, Antara Fairooz
dc.contributor.authorNawal, Nowshin
dc.contributor.departmentDepartment of Electrical and Electronic Engineering
dc.date.accessioned2026-09-07T03:46:55Z
dc.date.available2026-09-07T03:46:55Z
dc.date.issued2019-05-01
dc.description.abstractBy using ferroelectric material as gate insulator in MOSFET (NCFET), Sub-Threshold Swing can be reduced below the fundamental limit of 60mV per decade. Achieving the negative capacitance depends on the ability to drive ferro- electricity away from its local minimum to non-equilibrium state which is very unstable. It can be stabilized by adding a series capacitance. Hence, a ferroelectric capacitor in a series connection with a channel capacitor can be made to model a ferroelectric MOS capacitor to get a steeper Id-Vgs curve than a regular MOSFET.
dc.description.versionPublished
dc.format.extent6 Pages
dc.identifier.citationT. Rahman, A. F. Khan and N. Nawal, "Analysis of NCFET with Si Doped HfO2 as Ferro-Electric Material to Achieve Lower SS," 2019 1st International Conference on Advances in Science, Engineering and Robotics Technology (ICASERT), Dhaka, Bangladesh, 2019, pp. 1-6, doi: 10.1109/ICASERT.2019.8934575.
dc.identifier.doi10.1109/ICASERT.2019.8934575
dc.identifier.issn9781728134451
dc.identifier.other2-s2.0-85077986000
dc.identifier.urihttps://hdl.handle.net/10361/29789
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.hasversion10.1109/ICASERT.2019.8934575
dc.relation.ispartof1st International Conference on Advances in Science Engineering and Robotics Technology 2019 Icasert 2019
dc.relation.ispartofseries1st International Conference on Advances in Science Engineering and Robotics Technology 2019 Icasert 2019
dc.relation.urihttps://ieeexplore.ieee.org/document/8934575
dc.subjectCapacitance
dc.subjectMOSFET
dc.subjectLogic gates
dc.subjectIron
dc.subjectHafnium compounds
dc.subjectInsulators
dc.subjectCapacitors
dc.subjectNegative capacitance MOSFET
dc.subjectFerroelectric
dc.subjectHafnium oxide
dc.subject.lcshMetal oxide semiconductors field-effect transistors.
dc.subject.lcshFerroelectricity.
dc.titleAnalysis of NCFET with Si doped HfO2 as ferro-electric material to achieve lower SS
dc.typeConference Proceeding
person.affiliation.nameBRAC University
person.affiliation.nameBRAC University
person.affiliation.nameBRAC University
person.identifier.scopus-author-id57215315529
person.identifier.scopus-author-id57215323708
person.identifier.scopus-author-id59532366800

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