Analysis of NCFET with Si doped HfO2 as ferro-electric material to achieve lower SS
| bracu.type.group | Research Publications | |
| datacite.rights | Metadata Only | |
| dc.contributor.author | Rahman, Towfiqur | |
| dc.contributor.author | Khan, Antara Fairooz | |
| dc.contributor.author | Nawal, Nowshin | |
| dc.contributor.department | Department of Electrical and Electronic Engineering | |
| dc.date.accessioned | 2026-09-07T03:46:55Z | |
| dc.date.available | 2026-09-07T03:46:55Z | |
| dc.date.issued | 2019-05-01 | |
| dc.description.abstract | By using ferroelectric material as gate insulator in MOSFET (NCFET), Sub-Threshold Swing can be reduced below the fundamental limit of 60mV per decade. Achieving the negative capacitance depends on the ability to drive ferro- electricity away from its local minimum to non-equilibrium state which is very unstable. It can be stabilized by adding a series capacitance. Hence, a ferroelectric capacitor in a series connection with a channel capacitor can be made to model a ferroelectric MOS capacitor to get a steeper Id-Vgs curve than a regular MOSFET. | |
| dc.description.version | Published | |
| dc.format.extent | 6 Pages | |
| dc.identifier.citation | T. Rahman, A. F. Khan and N. Nawal, "Analysis of NCFET with Si Doped HfO2 as Ferro-Electric Material to Achieve Lower SS," 2019 1st International Conference on Advances in Science, Engineering and Robotics Technology (ICASERT), Dhaka, Bangladesh, 2019, pp. 1-6, doi: 10.1109/ICASERT.2019.8934575. | |
| dc.identifier.doi | 10.1109/ICASERT.2019.8934575 | |
| dc.identifier.issn | 9781728134451 | |
| dc.identifier.other | 2-s2.0-85077986000 | |
| dc.identifier.uri | https://hdl.handle.net/10361/29789 | |
| dc.language.iso | en_US | |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | |
| dc.relation.hasversion | 10.1109/ICASERT.2019.8934575 | |
| dc.relation.ispartof | 1st International Conference on Advances in Science Engineering and Robotics Technology 2019 Icasert 2019 | |
| dc.relation.ispartofseries | 1st International Conference on Advances in Science Engineering and Robotics Technology 2019 Icasert 2019 | |
| dc.relation.uri | https://ieeexplore.ieee.org/document/8934575 | |
| dc.subject | Capacitance | |
| dc.subject | MOSFET | |
| dc.subject | Logic gates | |
| dc.subject | Iron | |
| dc.subject | Hafnium compounds | |
| dc.subject | Insulators | |
| dc.subject | Capacitors | |
| dc.subject | Negative capacitance MOSFET | |
| dc.subject | Ferroelectric | |
| dc.subject | Hafnium oxide | |
| dc.subject.lcsh | Metal oxide semiconductors field-effect transistors. | |
| dc.subject.lcsh | Ferroelectricity. | |
| dc.title | Analysis of NCFET with Si doped HfO2 as ferro-electric material to achieve lower SS | |
| dc.type | Conference Proceeding | |
| person.affiliation.name | BRAC University | |
| person.affiliation.name | BRAC University | |
| person.affiliation.name | BRAC University | |
| person.identifier.scopus-author-id | 57215315529 | |
| person.identifier.scopus-author-id | 57215323708 | |
| person.identifier.scopus-author-id | 59532366800 |