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Few-shot learning-based machine fault diagnosis using EMD-gammatone spectrogram with limited labeled audio dataset

bracu.type.groupResearch Publications
datacite.rightsMetadata Only
dc.contributor.authorZabin M.
dc.contributor.authorAyon, Syed Tasnimul Karim
dc.contributor.authorSiraj, Farhan Md
dc.contributor.authorShuvo M.H.
dc.contributor.authorChoi H.J.
dc.contributor.authorUddin J.
dc.contributor.departmentDepartment of Computer Science and Engineering
dc.date.accessioned2026-07-15T03:35:34Z
dc.date.available2026-07-15T03:35:34Z
dc.date.issued2025-01-01
dc.description.abstractThe deep learning models are computationally burdensome, and their accuracy depends on the number of labeled datasets used in training. The scarcity of the labeled dataset in industrial machine diagnosis is a significant concern as it is pretty impossible to collect data from faulty machines in industrial environments. To address this issue, in this paper, we presented a few-shot learning-based machine fault diagnosis model on a lightweight SqueezeNet architecture using generated texture images from audio sensor data. Subsets of two public audio datasets, MIMII and ToyADMOS, containing limited data- 10 images per class were used to validate the model. The experimental results demonstrate that the model has exhibited 89.6% and 98.3% accuracy for MIMII and ToyADMOS, respectively, with only ten labeled images of each fault class. As the model has only 73 thousand trainable parameters and requires only 300 KB of memory, it is expected to be deployable in a portal device for machine fault diagnosis.
dc.description.versionPublished
dc.format.extent183-190
dc.identifier.citationM. Zabin, S. T. K. Ayon, F. M. Siraj, M. H. Shuvo, H. -J. Choi and J. Uddin, "Few-Shot Learning-Based Machine Fault Diagnosis Using EMD-Gammatone Spectrogram with Limited Labeled Audio Dataset," 2025 IEEE International Conference on Big Data and Smart Computing (BigComp), Kota Kinabalu, Malaysia, 2025, pp. 183-190, doi: 10.1109/BigComp64353.2025.00046.
dc.identifier.doi10.1109/BigComp64353.2025.00046
dc.identifier.issn2375933X
dc.identifier.issn9798331529024
dc.identifier.other2-s2.0-105006480360
dc.identifier.urihttps://hdl.handle.net/10361/28548
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.hasversion10.1109/BigComp64353.2025.00046
dc.relation.ispartofProceedings of the IEEE International Conference on Big Data and Smart Computing Bigcomp
dc.relation.ispartofseriesProceedings of the IEEE International Conference on Big Data and Smart Computing Bigcomp
dc.relation.urihttps://ieeexplore.ieee.org/document/10936870
dc.subjectEMD-gammatone spectrogram
dc.subjectFew-shot learning
dc.subjectMachine fault diagnosis
dc.subject.lcshMachinery--Maintenance and repair.
dc.titleFew-shot learning-based machine fault diagnosis using EMD-gammatone spectrogram with limited labeled audio dataset
dc.typeConference Proceedings
oaire.citation.issue2025
person.affiliation.nameKorea Advanced Institute of Science and Technology
person.affiliation.nameBRAC University
person.affiliation.nameBRAC University
person.affiliation.nameDhaka University of Engineering and Technology, Gazipur
person.affiliation.nameKorea Advanced Institute of Science and Technology
person.affiliation.nameWoosong University
person.identifier.scopus-author-id57222515475
person.identifier.scopus-author-id58777516900
person.identifier.scopus-author-id58777722600
person.identifier.scopus-author-id58571479500
person.identifier.scopus-author-id35073646600
person.identifier.scopus-author-id54994936900

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