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Few-shot learning-based machine fault diagnosis using EMD-gammatone spectrogram with limited labeled audio dataset

Citation

M. Zabin, S. T. K. Ayon, F. M. Siraj, M. H. Shuvo, H. -J. Choi and J. Uddin, "Few-Shot Learning-Based Machine Fault Diagnosis Using EMD-Gammatone Spectrogram with Limited Labeled Audio Dataset," 2025 IEEE International Conference on Big Data and Smart Computing (BigComp), Kota Kinabalu, Malaysia, 2025, pp. 183-190, doi: 10.1109/BigComp64353.2025.00046.

Abstract

The deep learning models are computationally burdensome, and their accuracy depends on the number of labeled datasets used in training. The scarcity of the labeled dataset in industrial machine diagnosis is a significant concern as it is pretty impossible to collect data from faulty machines in industrial environments. To address this issue, in this paper, we presented a few-shot learning-based machine fault diagnosis model on a lightweight SqueezeNet architecture using generated texture images from audio sensor data. Subsets of two public audio datasets, MIMII and ToyADMOS, containing limited data- 10 images per class were used to validate the model. The experimental results demonstrate that the model has exhibited 89.6% and 98.3% accuracy for MIMII and ToyADMOS, respectively, with only ten labeled images of each fault class. As the model has only 73 thousand trainable parameters and requires only 300 KB of memory, it is expected to be deployable in a portal device for machine fault diagnosis.

Description

Type

Conference Proceedings