Optimizing waste reduction through real-time defect detection in garment sewing using variants YOLOv7

bracu.type.groupResearch Publications
datacite.rightsMetadata Only
dc.contributor.authorUddin, Md. Minhaz
dc.contributor.authorAkter Sarmin, Sanzeda
dc.contributor.authorFoysal, Sadi Mahmud
dc.contributor.authorRahman, Sadia
dc.contributor.authorRisti, Nushara Tazrin
dc.contributor.authorRahman, Md. Khalilur
dc.contributor.departmentDepartment of Computer Science and Engineering
dc.date.accessioned2026-08-06T03:36:18Z
dc.date.available2026-08-06T03:36:18Z
dc.date.issued2024-01-01
dc.description.abstractIn the era of computer vision to overcome challenges, the introduction of the YOLO model revolutionized real-time computer vision approaches. In the garment industry, the inception of products plays a significant role while increasing the processing time with a good accuracy rate is the big challenge here. A real-time garments defect detection approach using YOLOv7, YOLOv7x, and YOLOv7-w6 on a primary dataset is proposed with a good FPS rate and better accuracy. Maximum traditional garments inception approaches focused on end product defects while this model suggests detecting defects in the sewing phase so that the cost of the rejected end product can be optimized by detecting them before a product goes through all the phases. For this our research focuses on three subclasses of Seam, Stitch, and Hole related to sewing phase defects. To increase the detection rate, the hyperparameter tuning technique is applied to the YOLOv7 model. Three models are proposed based on pre-trained weights of YOLOv7, YOLOv7x, and YOLOv7-w6 to compare the accuracy and FPS rate in terms of implementation in real-world projects.
dc.description.versionPublished
dc.format.extent6 Pages
dc.identifier.citationM. M. Uddin, S. Akter Sarmin, S. M. Foysal, S. Rahman, N. T. Risti and M. K. Rahman, "Optimizing Waste Reduction Through Real-Time Defect Detection in Garment Sewing Using Variants YOLOv7," 2024 IEEE International Conference on Computing, Applications and Systems (COMPAS), Cox's Bazar, Bangladesh, 2024, pp. 1-6, doi: 10.1109/COMPAS60761.2024.10797150.
dc.identifier.doi10.1109/COMPAS60761.2024.10797150
dc.identifier.issn9798331529765
dc.identifier.other2-s2.0-85215537469
dc.identifier.urihttps://hdl.handle.net/10361/28795
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.hasversion10.1109/COMPAS60761.2024.10797150
dc.relation.ispartof2024 IEEE Conference on Computing Applications and Systems Compas 2024
dc.relation.ispartofseries2024 IEEE Conference on Computing Applications and Systems Compas 2024
dc.relation.urihttps://ieeexplore.ieee.org/document/10797150
dc.subjectSewing
dc.subjectPattern recognition systems
dc.subjectGarments defects
dc.subjectHyperparameter tuning
dc.subjectIndustrial inspection
dc.subjectComputer vision
dc.subjectRoboflow
dc.subjectQuality control
dc.subjectYOLOv7
dc.subjectYOlOv7-w6
dc.subjectYOLOv7x
dc.subject.lcsh Real-time data processing.
dc.subject.lcshNeural networks (Computer science).
dc.titleOptimizing waste reduction through real-time defect detection in garment sewing using variants YOLOv7
dc.typeConference Proceeding
person.affiliation.nameBRAC University
person.affiliation.nameBRAC University
person.affiliation.nameBRAC University
person.affiliation.nameBRAC University
person.affiliation.nameBRAC University
person.affiliation.nameBRAC University
person.identifier.scopus-author-id59520611400
person.identifier.scopus-author-id59521046700
person.identifier.scopus-author-id59521160400
person.identifier.scopus-author-id60384093500
person.identifier.scopus-author-id59521046800
person.identifier.scopus-author-id57216983233

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
IMG_8345.jpg
Size:
27.35 KB
Format:
Joint Photographic Experts Group/JPEG File Interchange Format (JFIF)

License bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
license.txt
Size:
1.71 KB
Format:
Item-specific license agreed upon to submission
Description: