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dc.contributor.advisorHaque, Firoze H.
dc.contributor.advisorRahman, Muhammad Lutfor
dc.contributor.authorRatul, Mahadi Hassan
dc.date.accessioned2019-01-28T06:01:13Z
dc.date.available2019-01-28T06:01:13Z
dc.date.copyright2018
dc.date.issued2018-09
dc.identifier.otherID 12221085
dc.identifier.urihttp://hdl.handle.net/10361/11323
dc.descriptionThis thesis is submitted in partial fulfilment of the requirements for the degree of Bachelor of Science in Electrical and Electronic Engineering, 2018.en_US
dc.descriptionCatalogued from PDF version of thesis.
dc.descriptionIncludes bibliographical references( page 33).
dc.description.abstractA transistor is an electrical device made of semiconductor material that is used for operations such as amplification and switching of electronic signals and electrical power. A transistor to be used effectively and perform it’s full functions as amplifiers and switches, it is important to know its characteristics, electrical properties and operational specifications, it needs to be adaptable to the circuit’s current/voltage limits and other operating conditions. There are many types of transistors, such as Bipolar Junction Transistor (BJT) and Metal-Oxide Semiconductor Field-Effect Transistor (MOSFET), are used extensively in electrical circuits in applications for a diverse range of electrical devices. An electrometer is a device which is a measuring instrument with various applications and can be used to measure the current readings of a transistor subjected to different levels of input voltages. For the electrometer to function most efficiently, an application is made using LabVIEW software which allows for its remote access to accomplish functions such as conducting a voltage sweep (applying incremental voltages after short delays and recording the current). As the program is software controlled, it decreases the data acquisition time drastically and eliminates the factor of human error the source meter is used to apply different amount of voltages at the gate terminal of the transistor and the electrometer measures the different drain current values. Such a program, coupled with the electrometer and source-meter, promotes an efficient way of making a voltage sweep and displaying a graph of the input voltage and output current from the data obtained simultaneously. This enables us to characterize the transistors and the data can be used to identify whether the transistor can be used in a particular system or circuit.en_US
dc.description.statementofresponsibilityMahadi Hassan Ratul
dc.format.extent33 pages
dc.language.isoenen_US
dc.publisherBRAC Universityen_US
dc.rightsBRAC University theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission.
dc.subjectLabVIEWen_US
dc.subjectSemiconducting deviceen_US
dc.subject.lcshLabVIEW.
dc.subject.lcshScientific apparatus and instruments--Computer simulation.
dc.subject.lcshComputer graphics.
dc.titleSimultaneous interface application development for an electrometer and a source meter using LabVIEW to study three terminals semiconducting deviceen_US
dc.typeThesisen_US
dc.contributor.departmentDepartment of Electrical and Electronic Engineering, BRAC University
dc.description.degreeB. Electrical and Electronic Engineering


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