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Line profile-based fingerprint matching

dc.contributor.authorAli, Hafsa Moontari
dc.contributor.authorCorraya, Sonia
dc.contributor.departmentDepartment of Computer Science and Engineering
dc.date.accessioned2018-03-18T07:33:03Z
dc.date.available2018-03-18T07:33:03Z
dc.date.issued2/21/2017
dc.descriptionThis conference paper was published in the IWCI 2016 - 2016 International Workshop on Computational Intelligence [© 2016 IEEE.] and the definitive version is available at: http://doi.org/10.1109/IWCI.2016.7860350 The Journal's website is at: http://ieeexplore.ieee.org/document/7860350/?reload=trueen_US
dc.description.abstractTraditional fingerprint matching algorithms primarily focus on minutiae points on fingertip surface. In this paper, a novel approach is proposed for fingerprint matching that is based on ridge and valley characteristics of fingerprints. At first, the input fingerprint image is normalized and the registration point of that particular fingerprint is detected. Then a line profile is generated centering on that reference point. The distances between the reference point and ridges and the count of intersection points of line profile and ridges are stored in database. This process is repeated after every 15-degree angle to 345-degree in clock-wise direction and for orientation angle, the distances are stored sequentially. For matching intersection point count number along with the sequence of distance values are compared with the stored values. This new method can detect fingerprint from any orientation angle. Experimental result shows 90.87% accuracy of the proposed method.en_US
dc.description.versionPublished
dc.identifier.citationAli, H. M., & Corraya, S. (2017). Line profile-based fingerprint matching. Paper presented at the IWCI 2016 - 2016 International Workshop on Computational Intelligence, 115-119. 10.1109/IWCI.2016.7860350en_US
dc.identifier.doihttp://doi.org/10.1109/IWCI.2016.7860350
dc.identifier.isbn9.78E+12
dc.identifier.urihttp://hdl.handle.net/10361/9666
dc.language.isoenen_US
dc.publisher© 2017 Institute of Electrical and Electronics Engineers Inc.en_US
dc.relation.urihttp://ieeexplore.ieee.org/document/7860350/?reload=true
dc.subjectFingerprint matchen_US
dc.subjectLine profileen_US
dc.subjectRegistration pointen_US
dc.subjectRidge lineen_US
dc.subjectBiometricsen_US
dc.titleLine profile-based fingerprint matchingen_US
dc.typeConference Paperen_US

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