Advanced seed classification and defect detection using convolutional neural networks and unsupervised learning techniques

bracu.type.groupResearch Publications
datacite.rightsMetadata Only
dc.contributor.authorMunira, Sirazzum
dc.contributor.authorLamia A.I.
dc.contributor.authorHossain M.S.
dc.contributor.departmentDepartment of Electrical and Electronic Engineering
dc.date.accessioned2026-09-16T05:07:13Z
dc.date.available2026-09-16T05:07:13Z
dc.date.issued2025-01-01
dc.description.abstractThis paper introduces a hybrid deep learning framework for automated seed classification and defect detection in agricultural quality control. The system integrates supervised learning through Custom Convolutional Neural Networks (CustomCNN) and Attention-based CNNs (AttentionCNN) with unsupervised techniques including clustering algorithms and autoencoders. Working with high-resolution microscopic soybean seed images, the supervised models achieve test accuracies of 97.65% and 97.55% respectively for multi-class classification. The unsupervised autoencoder successfully identifies 312 anomalies through reconstruction error analysis. Clustering techniques partition RGB pixel data into three quality classes with silhouette scores up to 0.6810. This hybrid approach addresses key challenges in agricultural image analysis by enabling both accurate classification of labeled data and anomaly detection in unlabeled datasets, with processing times of 80-120ms per seed suitable for real-time deployment in seed sorting facilities.
dc.description.versionPublished
dc.format.extent1144-1149
dc.identifier.citationS. Munira, A. I. Lamia and M. S. Hossain, "Advanced Seed Classification and Defect Detection Using Convolutional Neural Networks and Unsupervised Learning Techniques," 2025 IEEE International Women in Engineering (WIE) Conference on Electrical and Computer Engineering (WIECON-ECE), Dhaka, Bangladesh, 2025, pp. 1144-1149, doi: 10.1109/WIECON-ECE69386.2025.11525962.
dc.identifier.doi10.1109/WIECON-ECE69386.2025.11525962
dc.identifier.issn9798331572693
dc.identifier.other2-s2.0-105042685153
dc.identifier.urihttps://hdl.handle.net/10361/29972
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.hasversion10.1109/WIECON-ECE69386.2025.11525962
dc.relation.ispartofIEEE International Wie Conference on Electrical and Computer Engineering Wiecon Ece
dc.relation.ispartofseriesIEEE International Wie Conference on Electrical and Computer Engineering Wiecon Ece
dc.relation.urihttps://ieeexplore.ieee.org/document/11525962
dc.rightsfalse
dc.subjectAgricultural AI
dc.subjectAttention mechanisms
dc.subjectAutoencoders
dc.subjectClustering
dc.subjectConvolutional neural networks
dc.subjectSeed classification
dc.subjectUnsupervised learning
dc.subject.lcshMachine learning.
dc.titleAdvanced seed classification and defect detection using convolutional neural networks and unsupervised learning techniques
dc.typeJournal
oaire.citation.issue2025
person.affiliation.nameBRAC University
person.affiliation.nameBangladesh Agricultural University
person.affiliation.nameBangladesh Agricultural University
person.identifier.scopus-author-id59187374000
person.identifier.scopus-author-id60409918900
person.identifier.scopus-author-id60706206400

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