Theoretical modeling of current measurement in nanoscale device considering Green's function formalism
Date
2015Publisher
© 2015 Institute of Electrical and Electronics Engineers Inc.Metadata
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Hassan, A., Mondol, R. K., Jafar, I. B., & Shahin, M. Z. I. (2015). Theoretical modeling of current measurement in nanoscale device considering green's function formalism. Paper presented at the Conference Proceeding - 2015 International Conference on Advances in Computer Engineering and Applications, ICACEA 2015, 988-992. doi:10.1109/ICACEA.2015.7164850Abstract
In recent years there are various way of predicting the current measurement through nanoscale device has been established. One of the most widely used and accepted is non-equilibrium Green's function method (NEGF). After NEGF method is approached scientist has worked a lot for describing the electronics characteristics in an easier way. Among them recursive algorithm is easier way of analyzing the electronics behavior through nanoscale devices only by mathematical modeling. By incorporating the Dyson's approximation and recursive algorithm, charge density is calculated for a definite nanostructured materials. In this paper we will first observe Dyson's approximation for calculating charge density as well as current density through the nanoscale devices. By using a unique and same dimension like length in all direction we will then calculate the current through the nanoscale device.
Keywords
Carrier transport; Charge density; Current density; Non-equilibrium green's function method; Recursive algorithmDescription
This conference paper was presented in the 2nd International Conference on Advances in Computer Engineering and Applications, ICACEA 2015; IMS Engineering CollegeGhaziabad; India; 19 March 2015 through 20 March 2015 [© 2015 Institute of Electrical and Electronics Engineers Inc.] The conference paper's definite version is available at: http://10.1109/ICACEA.2015.7164850Publisher Link
http://ieeexplore.ieee.org/document/7164850/Department
Department of Electrical and Electronic EngineeringType
Conference PaperCollections
- Conference Paper [8]