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dc.contributor.advisorRahman, Muhammad Lutfor
dc.contributor.authorMustafa, Anjum
dc.date.accessioned2019-07-25T04:34:30Z
dc.date.available2019-07-25T04:34:30Z
dc.date.copyright2019
dc.date.issued2019
dc.identifier.otherID 14215001
dc.identifier.urihttp://hdl.handle.net/10361/12424
dc.descriptionThis internship report is submitted in partial fulfillment of the requirements for the degree of Bachelor of Applied Physics and Electronics, 2019.en_US
dc.descriptionCataloged from PDF version of internship report.
dc.descriptionIncludes bibliographical references (page 18).
dc.description.abstractThis internship report mainly focuses on Investigating the IV characteristic curve of diode and resistor using Keihley 2450 source meter operated by lab view programming. Using the Lab view programming such configuration was made where voltage is supplied and the corresponding current had been calculated for several points for both diode and resistor. A voltage versus Current graph was plotted using Origin lab according to the data from the setup and was investigated and compared with the theoretical properties of the diode and resistor with authentic reference. The measured data followed the theory and almost gave the same characteristic curves which proves that the programming in Labview and the setup in Keithley 2450 source meter was accurate for the measurement.en_US
dc.description.statementofresponsibilityAnjum Mustafa
dc.format.extent18 pages
dc.language.isoenen_US
dc.publisherBrac Universityen_US
dc.rightsBrac University Internship reports are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission.
dc.subjectKeihley 2450en_US
dc.subjectIV characteristic curveen_US
dc.subjectSource Meter source measure uniten_US
dc.subjectResistoren_US
dc.subject.lcshSemiconductor lasers.
dc.titleInvestigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programmingen_US
dc.typeInternship reporten_US
dc.contributor.departmentDepartment of Mathematics and Natural Sciences, Brac University
dc.description.degreeB. Applied Physics and Electronics


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