Transient anode voltage modeling of IGBT and its base doping profile investigation
Date
2015-12Publisher
© 2015 Institute of Electrical and Electronics Engineers Inc.Metadata
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Das, A., & Khan, M. Z. R. (2015). Transient anode voltage modeling of IGBT and its base doping profile investigation. Paper presented at the 2015 18th International Conference on Computer and Information Technology, ICCIT 2015, 122-126. doi:10.1109/ICCITechn.2015.7488054Abstract
In many power converter applications, study of doping concentration in the carrier storage region of IGBT is considered desirable. This paper introduces an estimation technique for base doping concentration through investigation into transient anode voltage modeling of Non-punch through (NPT) Insulated Gate Bipolar Transistor (IGBT). Parabolic profile has been used for derivation of minority carrier concentration within the base. With the derived expression, an analytical model has been developed for turn-off anode voltage of IGBT in all doping profile conditions. Better agreements with the experimental results have been found compared to the previously used linear model. Finally, the implications of base doping dependence on the anode voltage are discussed, including implementation of such a doping concentration estimation technique
Keywords
Base doping concentration; Carrier storage region; Minority carrier lifetime; Parabolic approximation; Transient anode voltageDescription
This conference paper was presented in the 18th International Conference on Computer and Information Technology, ICCIT 2015; Military Institute of Science and Technology (MIST) Mirpur Cantonment Dhaka; Bangladesh; 21 December 2015 through 23 December 2015 [© 2015 Institute of Electrical and Electronics Engineers Inc.] The conference paper's definite version is available at: http://10.1109/ICCITechn.2015.7488054Department
Department of Electrical and Electronic Engineering, BRAC UniversityCollections
- Conference Paper [2]
- Faculty Publications [16]